Advances and Applications in Mechanical Engineering and TechnologyAuthor's: M. Rogante, L. Pallottini and E. Petricci
Pages: [167] - [181]
Received Date: May 4, 2010
Submitted by:
This paper concerns the Si(Li) crystal semiconductor technique adopted in the X-ray detection with main reference on material’s investigation. The theoretical bases and an experimental result are reported. In particular, the analogue-digital conversion by iterative approximations method is explained, and the operation of an amplitude discriminator realized through a Schmitt trigger, the anti-coincidence circuit, and the decade counter are described, focusing on their peculiarities. The considered technique, compared with the traditional ionization chamber, requires less energy, but the cooling procedures normally employed are still presenting some difficulties. The adoption of digital electronic supports will allow future developments in the investigation of materials of industrial interest.
X-ray, Si(Li) semiconductors, materials characterisation, analogue-digital conversion, decade counter, detector, Schmitt trigger.
